The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Sep. 01, 2023
Applicant:

Verkada Inc., San Mateo, CA (US);

Inventors:

Yu Yang, Palo Alto, CA (US);

Hanhong Gao, Fremont, CA (US);

Han Cao, San Mateo, CA (US);

Assignee:

Verkada Inc., San Mateo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 8/60 (2018.01); G06F 8/65 (2018.01); G06F 9/445 (2018.01); G06F 9/455 (2018.01); G06F 11/07 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 8/60 (2013.01);
Abstract

A first set of values reported by an electronic device and not reported by another electronic device over a first period of time that is prior to a firmware release to the electronic device is received. The first set of values is associated with a metric. A set of statistical properties associated with the first set of values is determined. A second set of values reported by the electronic device and not reported by another electronic device over a second period of time that is after the firmware release is received. The second set of values is associated with the metric. A set of statistical properties associated with the second set of values is determined. The set of statistical properties associated with the first set of values and the set of statistical properties associated with the second set of values is compared to detect an anomaly.


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