The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Jan. 10, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Shigeaki Nimura, Kanagawa, JP;

Shuji Ono, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/26 (2006.01); G02B 5/30 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
G02B 5/26 (2013.01); G02B 5/3083 (2013.01); H01L 27/14625 (2013.01);
Abstract

Provided a filter and an imaging apparatus for obtaining a higher-quality multispectral image in which the tint of the image is uniform. The filter includes: an optical filter layer; and a patterned retardation layer that is laminated on the optical filter layer. The optical filter layer includes at least three reflective layers that are formed of a cholesteric liquid crystal layer, and the reflective layers have different reflection center wavelengths. Alternatively, the optical filter layer includes a reflective layer that is formed of a cholesteric liquid crystal layer having at least two different reflection center wavelengths. The patterned retardation layer has a slow axis in a direction corresponding to the reflection center wavelength of the reflective layer.


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