The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Jan. 13, 2022
Applicant:

Magic Leap, Inc., Plantation, FL (US);

Inventors:

Robert D. Tekolste, Fort Lauderdale, FL (US);

Michael Klug, Austin, TX (US);

Assignee:

Magic Leap, Inc., Plantation, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 5/18 (2006.01); G02B 27/01 (2006.01); G02B 30/24 (2020.01); G02B 30/26 (2020.01); G02F 1/1334 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0081 (2013.01); G02B 5/1842 (2013.01); G02B 5/1871 (2013.01); G02B 27/0101 (2013.01); G02B 27/0172 (2013.01); G02B 30/24 (2020.01); G02B 30/26 (2020.01); G02F 1/1334 (2013.01); G03H 1/0408 (2013.01); G02B 2005/1804 (2013.01); G02B 2027/0109 (2013.01); G02B 2027/0123 (2013.01); G02B 2027/0125 (2013.01); G02B 2027/0134 (2013.01);
Abstract

Several unique configurations for interferometric recording of volumetric phase diffractive elements with relatively high angle diffraction for use in waveguides are disclosed. Separate layer EPE and OPE structures produced by various methods may be integrated in side-by-side or overlaid constructs, and multiple such EPE and OPE structures may be combined or multiplexed to exhibit EPE/OPE functionality in a single, spatially-coincident layer. Multiplexed structures reduce the total number of layers of materials within a stack of eyepiece optics, each of which may be responsible for displaying a given focal depth range of a volumetric image. Volumetric phase type diffractive elements are used to offer properties including spectral bandwidth selectivity that may enable registered multi-color diffracted fields, angular multiplexing capability to facilitate tiling and field-of-view expansion without crosstalk, and all-optical, relatively simple prototyping compared to other diffractive element forms, enabling rapid design iteration.


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