The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Apr. 09, 2021
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
Junxiao Zhou, San Diego, CA (US);
Zhaowei Liu, San Diego, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/00 (2006.01); G01B 9/08 (2006.01); G01B 11/24 (2006.01); G02B 5/30 (2006.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G02B 1/002 (2013.01); G01B 11/24 (2013.01); G02B 5/3025 (2013.01); G02B 27/286 (2013.01); G01B 9/08 (2013.01);
Abstract
In some example embodiments, there may be provided a metasurface for edge detection. The metasurface may include a nano or subwavelength surface structure configured to provide an output having optical separation to enable detection of at least one edge of an object being illuminated, wherein the optical separation is based on a phase profile configured on the nano or subwavelength surface structure of the metasurface.