The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Nov. 14, 2022
Applicant:

Wuhan University, Wuhan, CN;

Inventors:

Yigang He, Wuhan, CN;

Weiwei Zhang, Wuhan, CN;

Xiao Wang, Wuhan, CN;

Xiaoyu Liu, Wuhan, CN;

Liulu He, Wuhan, CN;

Mingyun Chen, Wuhan, CN;

Assignee:

WUHAN UNIVERSITY, Wuhan, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2608 (2013.01); G01R 31/2843 (2013.01);
Abstract

A method and a system for diagnosing an open circuit (OC) fault of an insulated gate bipolar transistor (IGBT) of a T-type three-level (T3L) inverter under multiple power factors based on instantaneous current distortion are provided. Similar characteristics of current distortion may be caused by an OC fault of a T3L inverter, making it is difficult to locate the fault. The method for diagnosing an OC fault of a grid-connected T3L inverter, can diagnose the OC fault hierarchically; four switch transistors in a phase can be divided into two groups according to the similarity analysis of current distortion under different power factors; group-based fault diagnosis is realized by half cycles in which a zero domain occurs; and then, a specific switching signal is injected to realize equipment-based OC fault diagnosis. The OC fault diagnosis of a T3L inverter is realized without additional hardware circuits.


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