The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Dec. 21, 2020
Applicant:

Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Thomas Haustein, Berlin, DE;

Paul Simon Holt Leather, Berlin, DE;

Ramez Askar, Berlin, DE;

Leszek Raschkowski, Berlin, DE;

Marcus Grossmann, Erlangen, DE;

Markus Landmann, Erlangen, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 29/10 (2006.01); H04B 7/06 (2006.01); H04B 17/11 (2015.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01); G01R 29/10 (2013.01); H04B 7/0695 (2013.01); H04B 17/11 (2015.01);
Abstract

A method for evaluating an apparatus having at least one antenna array, the apparatus configured for forming a plurality of communication beam patterns using the antenna array, includes positioning of the apparatus in a measurement environment or moving/switching the probe/link antenna(s) of the measurement environment around the apparatus adapted to measure beam patterns and controlling the apparatus so as to form a predefined beam pattern of the plurality of communication beam patterns. The method includes measuring the predefined beam pattern using the measurement environment and/or the apparatus.


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