The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Jun. 14, 2021
Jfe Steel Corporation, Tokyo, JP;
Takafumi Ozeki, Tokyo, JP;
Yutaka Matsui, Tokyo, JP;
Kazuki Terada, Tokyo, JP;
Daichi Izumi, Tokyo, JP;
Hiroki Imanaka, Tokyo, JP;
JFE STEEL CORPORATION, Tokyo, JP;
Abstract
Provided are a mechanical property measuring apparatus and method that can accurately measure a mechanical property through physical quantities, etc. A mechanical property measuring apparatus () comprises: a physical quantity measuring unit () configured to measure a plurality of physical quantities of a measured object that includes a substance and a film on a surface of the substance; a calculation model generating unit () configured to select a plurality of pieces of learning data and generate a calculation model for calculating a mechanical property of the substance; and a mechanical property calculating unit () configured to calculate the mechanical property of the substance using the calculation model generated and at least two of the plurality of physical quantities, wherein the selection physical quantities include at least one physical quantity measured using a first measurement signal and at least one physical quantity measured using a second measurement signal.