The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Mar. 12, 2020
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Hidenori Takahashi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/14 (2006.01); G01N 27/623 (2021.01); G01N 27/626 (2021.01);
U.S. Cl.
CPC ...
G01N 27/623 (2021.01); G01N 27/626 (2013.01); H01J 49/14 (2013.01);
Abstract

An ion analysis deviceconfigured to generate and analyze product ions from precursor ions derived from a sample component includes: a reaction chamberinto which the precursor ions are introduced; a radical emittermade of a predetermined kind of metal and disposed in the reaction chamber or a space communicating with the reaction chamber, at least a part of a surface of the radical emitter being oxidized or nitrided; a heating unitconfigured to heat the radical emitter to a predetermined temperature; and separation detection unitsandconfigured to separate and detect, according to at least one of a mass-to-charge ratio and an ion mobility, product ions generated from the precursor ions by a reaction with radicals emitted from the radical emitter heated to the predetermined temperature.


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