The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
May. 24, 2021
Ams Sensors Singapore Pte. Ltd., Singapore, SG;
Francesco Paolo D'Aleo, Zurich, CH;
Javier Miguel Sánchez, Zurich, CH;
Kotaro Ishizaki, Zurich, CH;
Peter Roentgen, Thalwil, CH;
AMS Sensors Singapore Pte. Ltd., Singapore, SG;
Abstract
According to a first aspect of the present invention there is provided a method of measuring the optical reflectance R of a target using a detection system comprising a light emitter and a light detector spaced apart from one another. The method comprises illuminating the target with the light emitter, detecting light reflected from the target using the light detector, wherein the light detector provides an electrical output signal Sindicative of the intensity of the detected light, and determining the optical reflectance R of the target according to (Formula 1), where Ris the spectral reflectance of a reference standard, Sis the detector electrical output signal with the reference standard in place, Sis the detector electrical output signal with no target in front of the light emitter and light detector, and M is a calibration factor.