The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Jun. 25, 2019
Applicant:
Teledyne Instruments, Inc., Thousand Oaks, CA (US);
Inventors:
Benjamin Staal, Belgrade, MT (US);
Stijn Van Malderen, Lokeren, BE;
James Barbula, Livingston, MT (US);
Assignee:
TELEDYNE INSTRUMENTS, INC., Thousand Oaks, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/40 (2006.01); G01N 1/04 (2006.01); G01N 35/10 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/04 (2013.01); G01N 35/1095 (2013.01); G01N 2001/045 (2013.01); G01N 35/00693 (2013.01);
Abstract
A system, apparatus configured to dynamically vary an extraction distance between an extraction volume and a sample surface through a probe assembly height adjustment apparatus operably coupled to a motor in which a processor can move the probe assembly height adjustment apparatus to maintain the extraction distance, or tune the extraction distance to optimize sampling performance. Methods for calibrating, tuning an extraction distance between an extraction volume and a sample surface.