The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Dec. 11, 2019
Applicant:
Hoya Lens Thailand Ltd., Pathumthani, TH;
Inventors:
Hua Qi, Tokyo, JP;
Takahiro Uchidani, Tokyo, JP;
Assignee:
HOYA LENS THAILAND LTD., Pathumthani, TH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); G01M 11/02 (2006.01); G02C 3/00 (2006.01); G02C 7/00 (2006.01); G02C 7/02 (2006.01); G02C 7/06 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0228 (2013.01); G02C 7/024 (2013.01); G02C 7/06 (2013.01); G02C 2202/24 (2013.01);
Abstract
Provided is a method for evaluating an eyeglass lens that has a plurality of convex portions on at least one of an object-side surface and an eyeball-side surface, in which the eyeglass lens is evaluated based on the number of rays at a plurality of focal positions A at which rays, which pave passed through the plurality of convex portions in a predetermined evaluation region of the eyeglass lens, converge when ray tracing is performed on the predetermined evaluation region, and technology related thereto.