The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Feb. 19, 2022
Applicant:

The Johns Hopkins University, Baltimore, MD (US);

Inventors:

Leo R. Gauthier, Jr., Ellicott City, MD (US);

Kenneth W. Harclerode, Pasadena, MD (US);

Assignee:

The Johns Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G01J 1/42 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/4257 (2013.01); G02B 21/06 (2013.01); H01S 3/0014 (2013.01); G01J 2001/4261 (2013.01);
Abstract

Provided herein are a system and a method thereof which allows for calibrating a laser or getting characteristics of the laser by measuring the temporally and spatially resolved beam profile and power density cross-section using non-contact radiometry. An example method includes receiving a radiation beam from a light source by protrusions that protrude from a plate. The example method further includes imaging the protrusions, measuring a respective temperature of each of the protrusions based on the imaging, and profiling the radiation beam based on the measuring.


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