The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Feb. 23, 2022
Robert Bosch Gmbh, Stuttgart, DE;
Frank Drautz, Kirchentellinsfurt, DE;
Paolo Minotti, Tuebingen, DE;
Clemens Jurgschat, Stuttgart, DE;
Alexander Sorger, Dresden, DE;
Michael Schiebold, Chemnitz, DE;
Natalie Koerte, Reutlingen, DE;
ROBERT BOSCH GMBH, Stuttgart, DE;
Abstract
A method for determining, measuring and/or monitoring properties of a sensor system. In the method, a controlled change of at least one system parameter of the sensor system takes place in such a way that prior to the controlled change, the system parameter includes a first value and assumes at least one further value as a result of the controlled change. At least one characteristic variable of the sensor system and/or a change of the at least one characteristic variable of the sensor system is/are determined for the at least one further value of the system parameter. The determination, measuring and/or monitoring of properties of the sensor system take place based the at least one further value of the system parameter and the at least one characteristic variable determined in the second step and/or the change of the at least one characteristic variable.