The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Nov. 01, 2018
Hitachi, Ltd., Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A method and apparatus for screening of cell lines and culture conditions includes a target value setting step that sets a target value relating to a metabolic reaction of a culture cell; a first culturing step; an analysis step; an analysis value calculation step that performs a metabolism analysis based on an analysis result from the analysis step and calculates an analysis value; a culture condition computation step that computes, using a correlation model, a culture condition giving an analysis value most close to the target value, and modifies the culture condition set in the first culturing step to the computed culture condition; a second culturing step that cultures a cell under the modified culture condition; and a screening step.