The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Aug. 05, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Hiroaki Ito, Tokyo, JP;

Shin Murata, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60R 21/0132 (2006.01); B60R 21/013 (2006.01); B60W 30/08 (2012.01);
U.S. Cl.
CPC ...
B60R 21/0132 (2013.01); B60W 30/08 (2013.01); B60R 2021/01302 (2013.01); B60W 2400/00 (2013.01);
Abstract

Provided is an anomaly detection device that acquires a degree of anomaly required for anomaly detection when a feature pattern of time series data changes over time. The anomaly detection device is a device that detects the degree of anomaly in the time series data. The anomaly detection device includes a first acquisition unit, a prediction unit, and an anomaly degree acquisition unit. The first acquisition unit acquires, from a first section that is a partial section of the time series data, a dynamic feature pattern of the first section. The prediction unit predicts data of a second section that is a partial section of the time series data later than the first section by using the feature pattern. The anomaly degree acquisition unit acquires the degree of anomaly based on a difference between the predicted second section data and actual data of the second section.


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