The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Jul. 17, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yohei Okawa, Kyoto, JP;

Kennosuke Hayashi, Kyoto, JP;

Yoshiya Shibata, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 13/00 (2006.01); B25J 9/16 (2006.01); B25J 13/08 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); B25J 9/1612 (2013.01);
Abstract

A control apparatus according to one or more embodiments may calculate a first estimate value of the coordinates of an endpoint of a manipulator based on first sensing data obtained from a first sensor system, calculates a second estimate value of the coordinates of the endpoint of the manipulator based on second sensing data obtained from a second sensor system, and adjust a parameter value for at least one of a first estimation model or a second estimation model to reduce an error between the first estimate value and the second estimate value based on a gradient of the error.


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