The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Jan. 12, 2022
Fujifilm Healthcare Corporation, Kashiwa, JP;
Yo Taniguchi, Chiba, JP;
Toru Shirai, Chiba, JP;
FUJIFILM Healthcare Corporation, Chiba, JP;
Abstract
To provide a technique of stably obtaining quantitative parameter maps by preventing influences of artifacts caused by flow or body motion when calculated images with a plurality of parameters are generated at the same time. When a calculated image of a subject parameter or an apparatus parameter is generated by using a plurality of images obtained by performing imaging under different imaging conditions, an imaging condition under which the artifacts are easy to occur is examined in advance, and an imaging parameter set for quantitative parameter map calculation is optimized by excluding the imaging condition under which the artifact is easy to occur.