The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Dec. 13, 2021
Applicant:

Microchip Technology Inc., Chandler, AZ (US);

Inventors:

Tamir Langer, Tel Aviv, IL;

Migel Jacubovski, Hod HaSharon, IL;

Assignee:

Microchip Technology Inc., Chandler, AZ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 17/082 (2006.01); G01K 7/01 (2006.01); H02H 5/04 (2006.01); H03K 17/08 (2006.01);
U.S. Cl.
CPC ...
H03K 17/0822 (2013.01); G01K 7/01 (2013.01); H02H 5/044 (2013.01); H03K 2017/0806 (2013.01);
Abstract

A method provides thermal protection for an IC device that has multiple components. For each component, temperatures are sensed, each of which associated with a different area of the respective component and a respective temperature sense signal is output indicative of the highest sensed temperature of the respective component. For each of the components, the respective temperature sense output signal is sampled to produce a sequence of discrete sampled temperature values. A sequence of differences between a reference temperature value and each of the discrete sample temperatures is integrated over time to compute, for each of the components, a respective integration output. The respective integration output computed for each of the switches is compared to a threshold value. An action related to the thermal protection function is initiated upon the integration output of an affected component exceeding the threshold value.


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