The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Aug. 18, 2021
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Seung Kyu Lee, Cheonan-si, KR;

Ki Pyo Hong, Hwaseong-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); G01R 31/26 (2020.01); G01R 31/54 (2020.01); H01L 25/16 (2023.01);
U.S. Cl.
CPC ...
H01L 22/14 (2013.01); G01R 31/2635 (2013.01); G01R 31/54 (2020.01); H01L 25/167 (2013.01);
Abstract

A method of inspecting a display device and a method of manufacturing a display device are provided. The display includes a substrate, a light emitting element on the substrate, a first contact electrode on one end of the light emitting element, and a second contact electrode spaced from the first contact electrode and on an other end of the light emitting element. The method of inspecting the display device includes applying a first inspection voltage and a second inspection voltage to the first contact electrode and the second contact electrode, respectively, and measuring a first inspection current, and while applying the first inspection voltage and the second inspection voltage to the first contact electrode and the second contact electrode, respectively, irradiating the light emitting element with inspection light and measuring a second inspection current.


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