The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

May. 18, 2023
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Hariharan Ravishankar, Bangalore, IN;

Dattesh Dayanand Shanbhag, Bangalore, IN;

Assignee:

GE Precision Healthcare LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 30/40 (2018.01); A61B 5/055 (2006.01); A61B 6/03 (2006.01); G06N 3/045 (2023.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01); G16H 30/20 (2018.01);
U.S. Cl.
CPC ...
G16H 30/40 (2018.01); A61B 5/055 (2013.01); A61B 6/032 (2013.01); G06N 3/045 (2023.01); G06T 7/0014 (2013.01); G06T 11/008 (2013.01); G16H 30/20 (2018.01); G06T 2207/10081 (2013.01); G06T 2207/10084 (2013.01); G06T 2207/10088 (2013.01);
Abstract

Methods and systems are provided for reconstructing images from measurement data using one or more deep neural networks according to a decimation strategy. In one embodiment, a method for reconstructing an image using measurement data comprises, receiving measurement data acquired by an imaging device, selecting a decimation strategy, producing a reconstructed image from the measurement data using the decimation strategy and one or more deep neural networks, and displaying the reconstructed image via a display device. By decimating measurement data to form one or more decimated measurement data arrays, a computational complexity of mapping the measurement data to image data may be reduced from O(N), where N is the size of the measurement data, to O(M), where M is the size of an individual decimated measurement data array, wherein M<N.


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