The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Oct. 15, 2021
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventor:

Tomochika Kurita, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16C 20/20 (2019.01);
U.S. Cl.
CPC ...
G16C 20/20 (2019.02);
Abstract

A crystal analysis method for a computer to execute a process includes creating a graph that indicates data of repeating unit cell in an ionic crystal and data of an adjacent repeating unit cell that is adjacent to the repeating unit cell; analyzing the ionic crystal based on the graph; and when a number of first intra-cell node that indicates data of an anionic atom bonded to a cationic atom in the repeating unit cell is n, setting a number of second intra-cell node that indicates data of the anionic atom in the repeating unit cell n−1 or less, wherein the data of repeating unit cell includes a plurality of intra-cell nodes that indicate data of atoms in the repeating unit cell, and the plurality of intra-cell nodes include the first intra-cell node and the second intra-cell node.


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