The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Jun. 09, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuka Ogino, Tokyo, JP;

Masato Tsukada, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G02B 3/12 (2006.01); G02B 7/04 (2021.01); G02B 7/36 (2021.01); H04N 23/67 (2023.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G02B 7/36 (2013.01); H04N 23/67 (2023.01);
Abstract

A photographing system according to one example embodiment includes a hardware photographing device configured to photograph each of a first pattern and a second pattern; at least one memory storing instructions; and at least one processor configured to execute the instructions to: set, for the hardware photographing device, a control value for changing the focal position; evaluate degrees of focus of a plurality of images of the first pattern and select an image having a maximum evaluation value, as well as evaluate degrees of focus of a plurality of images of the second pattern and select an image having a maximum evaluation value; and acquire a correspondence relationship between a focal position of an optical system and a control value, based on the control values used in capturing the images of the first pattern and the second pattern, and subject distances of the first pattern and the second pattern.


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