The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Sep. 14, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Yuichi Nakada, Kanagawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B41F 33/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); B41F 33/0036 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/30144 (2013.01);
Abstract
A detection sensitivity is set such that a detection sensitivity for a defect corresponding to a predetermined local pattern in a reference image, which is a reference printing result, is lower than for a region other than the predetermined local pattern in the reference image. Image data representing an image of an inspection target is acquired and the image of the inspection target is inspected based on the reference image and the set detection sensitivity.