The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Dec. 23, 2021
Seiko Epson Corporation, Tokyo, JP;
Ryohei Kuri, Minowa, JP;
SEIKO EPSON CORPORATION, , JP;
Abstract
An inspection method includes: a first acquisition step of acquiring information in which information on a color difference with respect to a reference color is assigned to each of a plurality of first divided regions into which an reference image is divided; a second acquisition step of acquiring information in which information on a color difference with respect to the reference color is assigned to each of a plurality of second divided regions into which a captured image is divided; a first comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the corresponding second divided regions; and a second comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the second divided regions in a combination different from the combination in which the comparison is performed in the first comparison step, and whether reference image data and the captured image data match each other is determined based on a first comparison result obtained in the first comparison step and a second comparison result obtained in the second comparison step.