The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Sep. 21, 2023
Applicant:
Align Technology, Inc., San Jose, CA (US);
Inventors:
Chao Shi, Morrisville, NC (US);
Yingjie Li, Cary, NC (US);
Chad Clayton Brown, Cary, NC (US);
Christopher E. Cramer, Durham, NC (US);
Assignee:
Align Technology, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/73 (2024.01); G06N 20/00 (2019.01); G06T 11/20 (2006.01); G06V 10/98 (2022.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 5/73 (2024.01); G06N 20/00 (2019.01); G06T 11/20 (2013.01); G06V 10/993 (2022.01); G06V 40/165 (2022.01); G06V 40/166 (2022.01); G06T 2210/12 (2013.01);
Abstract
A processing device receives an image and calculates a sharpness metric for a region of interest of the image. The processing device determines whether the sharpness metric satisfies a sharpness criterion, and one or more additional operations are performed responsive to determining that the sharpness metric satisfies the sharpness criterion.