The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Jan. 26, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventor:
Kodai Suzuki, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G06K 15/02 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06F 3/1234 (2013.01); G06F 3/121 (2013.01); H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00023 (2013.01);
Abstract
An overprinting inspection apparatus includes a processor configured to detect failure in overprinting by comparing succeeding print data and a succeeding image detected from a post-overprinting medium obtained by the overprinting. The overprinting is printing of the succeeding image based on the succeeding print data over a pre-overprinting medium on which a preceding image has been printed based on preceding print data.