The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Sep. 21, 2021
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventor:

Zongyi Yang, Eatontown, NJ (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01); G06T 15/20 (2011.01);
U.S. Cl.
CPC ...
G06F 18/214 (2023.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 15/20 (2013.01);
Abstract

In various examples, sets of testing data may be selected and applied to an MLM such that differences in performance of the MLM in the testing between the sets indicates and may be used to determine whether and/or an extent by which the MLM is trained to rely on artifacts. Training data for the MLM may be generated using a first value of a parameter that defines a value of a characteristic of the training data. For testing, first testing data may be selected that corresponds to a second value of the parameter that shifts the value in a first direction and second testing data may be selected that corresponds to a third value of the parameter that shifts the value in a second direction (e.g., opposite the first direction). Various possible actions may be taken based on results of analyzing the differences in performance.


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