The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Jul. 19, 2022
Applicant:
Kyndryl, Inc., New York, NY (US);
Inventor:
Mouleswara Reddy Chintakunta, Allagadda, IN;
Assignee:
Kyndryl, Inc., New York, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 16/178 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/1794 (2019.01); G06F 16/258 (2019.01);
Abstract
Embodiments of the present invention provide an approach for identifying outliers (e.g., detecting the outliers and generating outlier explainability) in a heterogeneous system. Heterogeneous input data is received from any number of data sources having any number of data types and converted into a single predefined format. Global outliers are detected in a first pass of the data. Contextual outliers are detected in a second pass. Global and contextual outliers are then collectively grouped based on outlier type. Output data is then generated including explainability for each detected outlier.