The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Aug. 06, 2020
Leica Biosystems Imaging, Inc., Vista, CA (US);
Yunlu Zou, Vista, CA (US);
Leica Biosystems Imaging, Inc., Vista, CA (US);
Abstract
Physical calibration slide comprising a plurality of etched features. The etched features may comprise two or more of a slanted Ronchi ruling feature comprising at least one set of parallel lines that are slanted with respect to a long and short axis of the slide, a straight Ronchi ruling feature comprising at least one set of parallel lines that are parallel to either the long or short axis, a star target feature comprising a circle with a plurality of wedge pairs, a crosshair feature comprising at least one crosshair, a clear area, a letter-O feature comprising a circle, a resolution target feature comprising one or more resolution targets, a bullseye feature comprising a two-dimensional array of bullseyes, a triangle feature comprising at least one isosceles triangle, or a symmetric corers feature comprising two symmetric sets of geometric shapes arranged in an L-shape.