The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Aug. 06, 2020
Institut National DE LA Sante ET DE LA Recherche Medicale (Inserm), Paris, FR;
Université DE Tours, Tours, FR;
Centre Hospitalier Regional Universitaire DE Tours, Tours, FR;
Christophe Destrieux, Tours, FR;
Laurent Barantin, Tours, FR;
INSTITUT NATIONAL DE LA SANTE ET DE LA RECHERCHE MEDICALE (INSERM), Paris, FR;
UNIVERSITE DE TOURS, Tours, FR;
CENTRE HOSPITALIER REGIONAL UNIVERSITAIRE DE TOURS, Tours, FR;
Abstract
The invention relates to quality control devices and methods for magnetic resonance imaging (MRI) systems, more particularly for medical imaging applications. An example is stereotactic surgery where MRI images are combined with X-ray images to accurately locate a target in a subject. A test device (), and an associated method using said test object, are used to easily detect a faulty calibration or a malfunction of an MRI device. The test device includes: a hermetically sealable hollow body () having a substantially cylindrical shape, a support frame () configured to be removably inserted in the hollow body and defining a target region (V) having a substantially cylindrical shape; and a plurality of target objects () made of a material visible on X-ray images and MRI images said target objects being arranged in the target region and being attached to the support frame.