The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Dec. 02, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Tsukasa Suenari, Tokyo, JP;

Masashi Akutsu, Tokyo, JP;

Hiroyuki Mishima, Tokyo, JP;

Takeshi Setomaru, Tokyo, JP;

Akihiro Yasui, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 33/5302 (2013.01); G01N 35/02 (2013.01);
Abstract

The present invention comprises: an incubator diskupon which a plurality of reaction containers holding a reaction solution being an analyte and a reagent that have been mixed and reacted are mounted; a immunoassay unitthat measures the physical properties of the reaction solution; and a planning unitthat determines the order for measurement of analyte requested to be executed by the immunoassay unit. Measurement by the immunoassay unitincludes items having different measurement times. When measurement of sequence items having the longest measurement time will occur at least a prescribed number of times in a row, said prescribed number being at least two, the planning unitprovides at least one empty cycle after measurement has occurred at least the prescribed number of times.


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