The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Dec. 20, 2019
Applicant:
Kenota Inc., Kitchener, CA;
Inventors:
Christopher J. Harder, Elmira, CA;
David Andrew McMullin, Ottawa, CA;
Eric Blondeel, Waterloo, CA;
Kien Vu, Nepean, CA;
Assignee:
Kenota Inc., Kitchener, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/05 (2006.01); G01N 33/543 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54388 (2021.08); G01N 21/05 (2013.01); G01N 35/1009 (2013.01); G01N 35/1065 (2013.01); G01N 35/1081 (2013.01); G01N 2035/00356 (2013.01); G01N 2035/00455 (2013.01); G01N 2035/1025 (2013.01);
Abstract
Described is a lateral flow high throughput assay device analyzer for preparing and analyzing a plurality of lateral flow assay samples. The analyzer comprises a cartridge stage for supporting an assay cartridge, an elevation adjustment mechanism, and a translation adjustment mechanism for aligning the cartridge stage and assay cartridge relative to a vertical support structure, fluid metering device, and detection device for high throughput lateral flow assay analysis.