The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Dec. 10, 2019
Applicant:

Hitachi Zosen Corporation, Osaka, JP;

Inventors:

Kaoru Shinoda, Osaka, JP;

Masamitsu Abe, Osaka, JP;

Joichi Murakami, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01N 29/04 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01N 29/04 (2013.01); G01N 29/4418 (2013.01);
Abstract

An ultrasonic phased array detection device sequentially performing flaw detection testing on a welded joint of tubes arranged in a row. The ultrasonic phased array detection device includes: a flaw detection testing unit inserted into a target tube targeted for flaw detection testing among the tubes, and performing flaw detection testing on the welded joint of the target tube; a drive mechanism rotating the flaw detection testing unit around an axis of the target tube; and a jig to be inserted and fixed in a tube different from the target tube. The flaw detection testing unit has a flaw detection part incorporating a phased array probe performing ultrasonic phased array method, and has a pressing mechanism pressing the flaw detection part against an inner surface of the target tube.


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