The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Jul. 26, 2023
Applicant:

Gemological Institute of America, Inc. (Gia), Carlsbad, CA (US);

Inventors:

Tsung-Han Tsai, Maywood, NJ (US);

Hiroshi Takahashi, Fort Lee, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/28 (2006.01); G01N 21/65 (2006.01); G01N 21/87 (2006.01);
U.S. Cl.
CPC ...
G01N 21/87 (2013.01); G01J 3/2823 (2013.01); G01N 21/65 (2013.01); G01J 2003/2836 (2013.01); G01N 2021/656 (2013.01);
Abstract

Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.


Find Patent Forward Citations

Tsai, Tsung-Han. (2024). Imaging assisted scanning spectroscopy for gem identification (U.S. Patent No. 12085511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12085511

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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