The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Jan. 31, 2020
Imagine Optic, Orsay, FR;
Fabrice Harms, Orsay, FR;
Xavier Levecq, Gif-sur-Yvette, FR;
IMAGINE OPTIC, Orsay, FR;
Abstract
A device for analysing a wavefront may be connected to a fluorescence microscopy imaging system with optical sectioning, equipped with a microscope objective including a pupil in a pupil plane, the analysis device including a two-dimensional detector including a detection plane; a two-dimensional arrangement of microlenses, arranged in an analysis plane, each microlens forming, on the detection plane, when the analysis device is connected to the microscopic imaging system, an image of an object situated in a focal plane of the microscope objective, with a given analysis field; an optical relay system optically conjugating the analysis plane and the pupil plane; a field diaphragm positioned in a plane optically conjugated with the plane of detection, and defining said analysis field; a processing unit that determines, based on the set of images formed by the microlenses, a two-dimensional map of a characteristic parameter of the wavefront in said analysis plane.