The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

May. 20, 2022
Applicant:

South China University of Technology, Guangzhou, CN;

Inventors:

Xiangjun Gong, Guangzhou, CN;

Wenzhang Tian, Guangzhou, CN;

Yongping Zeng, Guangzhou, CN;

Lianjun Bao, Guangzhou, CN;

Guangzhao Zhang, Guangzhou, CN;

Xiao Liang, Guangzhou, CN;

Xiawen Qiu, Guangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 13/00 (2006.01); G01N 33/18 (2006.01);
U.S. Cl.
CPC ...
G01N 21/645 (2013.01); G01N 13/00 (2013.01); G01N 33/1826 (2013.01); G01N 2013/003 (2013.01); G01N 2021/6471 (2013.01); G01N 2021/6478 (2013.01); G01N 2021/6484 (2013.01);
Abstract

Provided are a synchronous fluorescence detector for observing the interface concentration of fluorescent pollutants and application method. The detector comprises a first electric displacement platform, a quartz cuvette, an excitation light path, a collection light path and a second electric displacement platform. The application method comprises the following steps: first exciting fluorescent pollutants by utilizing UV light with specific wavelengths to emit fluorescent light; then collecting fluorescence signals emitted by the excited fluorescent pollutants to the greatest extent by utilizing an UV anti-reflection convex lens combination; and finally, processing the fluorescent signals acquired by a photomultiplier by utilizing a difference method to determine a precise light intensity of a thin layer which is moved at a specific spacing by utilizing the electric displacement platforms so as to determine fugacity distribution of the fluorescent pollutants in the microlayer near an interface.


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