The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Aug. 31, 2020
Applicant:

Nok Corporation, Tokyo, JP;

Inventors:

Yuta Kasai, Fujisawa, JP;

Shotaro Karube, Fujisawa, JP;

Hikaru Tadano, Fujisawa, JP;

Masashi Takekoshi, Fujisawa, JP;

Takayuki Sakurai, Fujisawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/20 (2006.01); H01M 8/0271 (2016.01); H01M 8/04664 (2016.01);
U.S. Cl.
CPC ...
G01M 3/20 (2013.01); H01M 8/0271 (2013.01);
Abstract

A seal inspection device includes: a first holder including a port surrounded by an inspection target, and a through hole connected to an outside-leak detection flow path; a second holder holding the inspection target between the first and second holders; an inspection-place sealing portion forming, into a closed space, a space where the inspection target is arranged, in cooperation with the first and second holders; a pressurization valve connecting the port to both a supply source of an inspection gas and an exhaust system; a detector for the inspection gas; a first measurement valve connecting the detector to the port; and a second measurement valve connecting the outside-leak detection flow path to the detector.


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