The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Jun. 30, 2022
Applicant:

Hiwin Mikrosystem Corp., Taichung, TW;

Inventors:

Mikhail Tiapkin, Taichung, TW;

Oleg Tolstykh, Taichung, TW;

Gennady Tyapkin, Taichung, TW;

Aleksandr Balkovoi, Taichung, TW;

Assignee:

HIWIN MIKROSYSTEM CORP., Taichung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/16 (2006.01); G01D 5/14 (2006.01);
U.S. Cl.
CPC ...
G01D 5/16 (2013.01); G01D 5/147 (2013.01);
Abstract

The invention discloses a multi-sensor position measurement system mainly comprising a base, a carrier and a modular component, the carrier is provided with a first signal array and a second signal array. The modular component is disposed on the base, and comprises two Hall sensors for sensing magnetic field changes of the first signal array, two magnetoresistive sensors for sensing magnetic field changes of the second signal array, and a first state sensor having a marking unit disposed on the carrier and a sensitive element disposed on the base for sensing signals generated by the marking unit for subsequent reference signal generation, connection of measurement results between other sensors, and identification of homing direction.


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