The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Feb. 26, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Tatsuya Mori, Tokyo, JP;

Hiroko Ikeda, Tokyo, JP;

Toshihiro Matsunaga, Tokyo, JP;

Kenji Ikeda, Tokyo, JP;

Kenta Kubo, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/20 (2006.01); G01D 3/00 (2006.01); G01B 7/30 (2006.01);
U.S. Cl.
CPC ...
G01D 3/00 (2013.01);
Abstract

To provide an abnormality detection apparatus for resolver which can determine the abnormality of at least the first system, even if the period of the excitation AC voltage of the first system and the period of the excitation AC voltage of the second system are different periods, and the magnetic interference between systems occurs. An abnormality detection apparatus for resolver applies an AC voltage of a first period to a first system excitation winding; applies an AC voltage of a second period different from the first period to a second system excitation winding; calculates DC values of first system two output signals by performing a DC extraction processing; and determines abnormality of first system based on whether or not the DC values of first system two output signals are within a normal range.


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