The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Mar. 20, 2023
Faro Technologies, Inc., Lake Mary, FL (US);
Johannes Buback, Korntal-Munchingen, DE;
Igor Sapina, Kornwestheim, DE;
Julian Becker, Korntal-Munchingen, DE;
Martin Ossig, Tamm, DE;
Aleksej Frank, Kornwestheim, DE;
Ahmad Ramadneh, Kornwestheim, DE;
Oliver Zweigle, Stuttgart, DE;
João Santos, Kornwestheim, DE;
FARO Technologies, Inc., Lake Mary, FL (US);
Abstract
A system and method for measuring three-dimensional (3D) coordinate values of an environment is provided. The system includes a movable base unit a first scanner and a second scanner. One or more processors performing a method that includes causing the first scanner to determine first plurality of coordinate values in a first frame of reference based at least in part on a measurement by at least one sensor. The second scanner determines a second plurality of 3D coordinate values in a second frame of reference as the base unit is moved from a first position to a second position. The determining of the first coordinate values and the second plurality of 3D coordinate values being performed simultaneously. The second plurality of 3D coordinate values are registered in a common frame of reference based on the first plurality of coordinate values.