The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Sep. 23, 2023
Applicants:

Hamamatsu Photonics K.k., Shizuoka, JP;

Energetiq Technology, Inc., Wilmington, MA (US);

Inventors:

Qingsong Wang, Lexington, MA (US);

Shaival Vipul Buch, Watertown, MA (US);

Huiling Zhu, Lexington, MA (US);

Assignees:

HAMAMATSU PHOTONICS K.K., Shizuoka, JP;

ENERGETIQ TECHNOLOGY, INC., Wilmington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02091 (2022.01); G01B 9/02 (2022.01); G01B 9/02055 (2022.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/02044 (2013.01); G01B 9/0207 (2013.01); G01N 21/4795 (2013.01);
Abstract

An OCT system includes a broadband light source and illumination optics that projects the generated broadband light to a sample where the light is scattered from within the sample in a direction that is normal to a surface of the sample to form a sample beam and is reflected from a top surface of the sample in a direction that is normal to the surface of the sample to form a reference beam where the sample beam and reference beam co-propagate. Collection optics collect light in the sample and reference beams and project the light to an interferometric combiner. The interferometric combiner is configured to interferometrically the collected light from the sample beam and collected light from the reference beam and to project the interferometrically combined light to a spectrometer that generates spectral interferometric information to determine information about the sample.


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