The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Apr. 22, 2021
Applicant:

Totani Corporation, Kyoto, JP;

Inventor:

Yuji Ohnishi, Kyoto, JP;

Assignee:

Totani Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B31B 70/00 (2017.01); B31B 70/10 (2017.01); B31B 70/26 (2017.01); B31B 155/00 (2017.01); B31B 160/20 (2017.01);
U.S. Cl.
CPC ...
B31B 70/006 (2017.08); B31B 70/10 (2017.08); B31B 70/266 (2017.08); B31B 2155/002 (2017.08); B31B 2160/20 (2017.08);
Abstract

A defect detecting device includes a detection unit and a movement mechanism. The detection unit includes a support, an arm supported by the support swingably around a swing shaft, and a sensor for detecting a displacement of the arm relative to the support. The arm includes contactors. The movement mechanism keeps the contactors away from a feed plane during a feed phase of a sheet panel, and moves the contactors to the feed plane and then moves the contactors from the feed plane during a pause phase of the sheet panel. The defect detecting device further includes a determination part configured to determine whether a defect in bag making is present based on data from the sensor.


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