The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Jun. 29, 2020
Applicant:

Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;

Inventors:

Yuichi Senoo, Saitama, JP;

Katsuhiko Hayashi, Saitama, JP;

Junki Tomita, Saitama, JP;

Takahiro Kogawa, Saitama, JP;

Akihiro Kanno, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01J 29/00 (2006.01); B01J 29/70 (2006.01); B01J 35/50 (2024.01); B01J 35/58 (2024.01); C01B 39/46 (2006.01); C07C 4/06 (2006.01);
U.S. Cl.
CPC ...
B01J 29/7057 (2013.01); B01J 35/50 (2024.01); B01J 35/58 (2024.01); C01B 39/46 (2013.01); C07C 4/06 (2013.01); B01J 2229/18 (2013.01); C01P 2002/72 (2013.01); C07C 2529/70 (2013.01);
Abstract

Provided is a beta zeolite satisfying P>76.79Q−29.514 in a range in which Q is less than 0.4011 nm, wherein, P represents an AB value that is an intensity ratio of A to B, A represents a diffraction intensity of a main peak of the beta zeolite observed by X-ray diffraction measurement, B represents a diffraction intensity of the (116) plane of α-alumina obtained by X-ray diffraction measurement under the same conditions as those for the X-ray diffraction measurement on the beta zeolite, the α-alumina being the standard substance 674a distributed by the American National Institute of Standards and Technology, and Q represents a lattice interplanar spacing of the main peak of the beta zeolite observed by X-ray diffraction measurement. It is preferable that the formula (1) above is satisfied in a range in which Q is from 0.3940 to 0.4000 nm.


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