The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Mar. 27, 2020
Applicants:

Alireza Mirbagheri, Tehran, IR;

Golchehr Amirkhani, Tehran, IR;

Seiedmuhammad Yazdian, Tehran, IR;

Farzam Farahmand, Tehran, IR;

Saeed Sarkar, Tehran, IR;

Inventors:

Alireza Mirbagheri, Tehran, IR;

Golchehr Amirkhani, Tehran, IR;

Seiedmuhammad Yazdian, Tehran, IR;

Farzam Farahmand, Tehran, IR;

Saeed Sarkar, Tehran, IR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 34/00 (2016.01); A61B 18/00 (2006.01); A61B 34/37 (2016.01);
U.S. Cl.
CPC ...
A61B 34/77 (2016.02); A61B 2018/00636 (2013.01); A61B 2018/00916 (2013.01); A61B 34/37 (2016.02); A61B 34/75 (2016.02); A61B 34/76 (2016.02);
Abstract

A method for controlling a laparoscopic instrument. The method includes grasping a target utilizing the laparoscopic instrument by applying an initial trigger force to a trigger of the laparoscopic instrument, obtaining an updated trigger force based on a first pinch force, a second pinch force, and a state of the laparoscopic instrument, and grasping the target utilizing the laparoscopic instrument by applying the updated trigger force to the laparoscopic instrument. The first pinch force is applied to the target by an upper jaw of the laparoscopic instrument and the second pinch force is applied to the target by a lower jaw of the laparoscopic instrument.


Find Patent Forward Citations

Loading…