The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Aug. 27, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Rubayet Shafin, Allen, TX (US);

Vishnu Vardhan Ratnam, Plano, TX (US);

Hao Chen, Allen, TX (US);

Yan Xin, Princeton, NJ (US);

Jianzhong Zhang, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); G01S 5/02 (2010.01); G06N 20/00 (2019.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 64/006 (2013.01); G01S 5/0218 (2020.05); G06N 20/00 (2019.01); H04W 24/10 (2013.01);
Abstract

A method for performing line-of-sight (LoS)/non-line-of-sight (NLoS) filtering includes collecting, from at least one user equipment (UE) operating within a coverage area of a base station, a plurality of measurement reports from the at least one UE, wherein each measurement report of the plurality of measurement reports comprises a measured value of a signal parameter and location information of the at least one UE. The method further includes training a LoS/NLoS classification model on the plurality of measurement reports, obtaining a new measurement report from a UE operating at a first location within the coverage area of the base station and passing the new measurement report from the UE to the trained LoS/NLoS classification model to obtain a LoS/NLoS classification of the first location.


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