The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Jan. 06, 2021
Apple Inc., Cupertino, CA (US);
Jie Cui, San Jose, CA (US);
Yang Tang, San Jose, CA (US);
Herbert R. Dawid, Herzogenrath, DE;
Panagiotis Botsinis, Munich, DE;
Yihong Qi, Santa Clara, CA (US);
Dawei Zhang, Saratoga, CA (US);
Hong He, San Jose, CA (US);
Manasa Raghavan, Sunnyvale, CA (US);
Qiming Li, Beijing, CN;
Xiang Chen, Campbell, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A user equipment (UE) may perform configured to perform layer 1 (L1) measurements and layer 3 (L3) measurements. The UE receives a first configuration for layer 1 (L1) measurements of a resource set comprising a plurality of reference signals (RS) and a second configuration for layer 3 (L3) measurements, the first configuration including periodic measurement occasions and a reporting periodicity for transmitting measurement reports comprising the L1 measurements, determines the L3 measurements collide with at least one of the plurality of RSs for the L1 measurements, wherein the colliding causes a determination of the L1 measurements to be muted for the at least one RS during at least one of the measurement occasions and alters at least a first measurement report so that the L1 measurements that collide with the L3 measurements are not reported in at least one reporting periodicity.