The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Jan. 16, 2020
Applicants:

Sharp Kabushiki Kaisha, Sakai, JP;

Fg Innovation Company Limited, Tuen Mun, HK;

Inventors:

Chao Luo, Shanghai, CN;

Renmao Liu, Shanghai, CN;

Tomoki Yoshimura, Sakai, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 5/00 (2006.01); H04W 72/23 (2023.01);
U.S. Cl.
CPC ...
H04L 1/0091 (2013.01); H04L 1/0023 (2013.01); H04L 1/0079 (2013.01); H04L 5/0053 (2013.01); H04W 72/23 (2023.01);
Abstract

A method performed by a UE is provided. The method determines a first size of a first DCI format and a second size of a second DCI format monitored in a common search space (CSS). The method determines a third size of the first DCI format and a fourth size of the second DCI format monitored in a USS. The method aligns the first size with the second size, and aligns the third size with the fourth size. The method determines at least one of a size of a third DCI format and a size of a fourth DCI format monitored in the USS, and adjusts at least one of the determined sizes of the third and fourth DCI formats, such that the adjusted size is not equal to any of the aligned first size, the aligned second size, the aligned third size, or the aligned fourth size.


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