The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Sep. 29, 2020
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventor:

James Hager, Mississauga, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G06F 17/14 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); G06F 17/142 (2013.01); H01J 49/063 (2013.01);
Abstract

In one aspect, a method of calibrating a Fourier Transform (FT) multipole mass spectrometer is disclosed, which comprises measuring a plurality of secular frequencies of a calibrant ion in a multipole FT mass analyzer for a plurality of RF voltages (V) applied to at least one rod of the multipole mass analyzer, calculating Mathieu β and q parameters for each of 5 the measured secular frequencies, and determining RF voltage amplitude (V) for each calculated q parameter. For each calculated q parameter, an offset RF voltage amplitude (ΔV) corresponding to a deviation of the applied Vand the calculated Vis determined so as to generate a ΔVv.s. q calibration curve.


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