The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Jun. 30, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kangseok Lee, Seoul, KR;

Geunyeong Yu, Seongnam-si, KR;

Seonghyeog Choi, Hwaseong-si, KR;

Hongrak Son, Anyang-si, KR;

Youngjun Hwang, Osan-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/02 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G11C 29/52 (2013.01); G11C 29/021 (2013.01); G11C 29/022 (2013.01);
Abstract

In a method of error correction code (ECC) decoding, normal read data are read from a nonvolatile memory device based on normal read voltages, and a first ECC decoding is performed with respect to the normal read data. When the first ECC decoding results in failure, flip read data are read from the nonvolatile memory device based on flip read voltages corresponding to a flip range of a threshold voltage. Corrected read data are generated based on the flip read data by inverting error candidate bits included in the flip range among bits of the normal read data, and a second ECC decoding is performed with respect to the corrected read voltage. Error correction capability may be enhanced by retrying ECC decoding based on the corrected read data when ECC decoding based on the normal read data results in failure.


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