The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Nov. 08, 2021
Flowview Tek, Taipei, TW;
You-Yuan Jhong, Taipei, TW;
FlowVIEW Tek, Taipei, TW;
Abstract
The image analysis method of the disclosure includes following steps: obtaining an image of a multi-layer structure provided by an electron microscope and displaying the image of the multi-layer structure through a display device, wherein the image of the multi-layer structure is a gray-scale image; setting a measurement line segment on the image of the multi-layer structure, wherein the measurement line segment extends along a first direction; detecting a gray-scale distribution within the measurement line segment corresponding to the image of the multi-layer structure along the measurement line segment; and analyzing the gray-scale distribution to determine a plurality of dark layer thicknesses and a plurality of light layer thicknesses according to a threshold range.